Study of photons reflection on rough surface

摘要

The purpose of this paper is to study the probability distribution of photon reflection on rough surface experimentally and theoretically. We showed experimentally that for photon reflection on rough surface, the distribution was characterized by the ratio τ/σ, which was defined as the "correlation roughness" of the reflecting surface. Quantitative experimental results based on single-photon counter are compared to the Monte Carlo simulation results. At last, how the intensity of low light-level can be retrieved from photon counting results using improved models is shown.