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The computer simulation of cluster induced desorption of molecules

机译:簇诱导分子解吸的计算机模拟

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摘要

Molecular dynamics computer simulation has been used to investigate the desorption phenomenon that takes place when an energetic molecule or cluster impacts a solid surface. The use of clusters and molecules in secondary ion mass spectrometry (SIMS) is growing as it is becoming evident that the yield of ionised particles is high by comparison with the more conventional single ion sputtering beam. It has also been noticed that there is a much higher desorption of intact molecular ions ejected from the surface. Computer simulations have demonstrated why this should happen. The cluster impact stimulates correlated motion in the surface of the target which encourages the gentle lift off of large molecular species from the target surface. The technique is finding particular uses in allowing SIMS techniques to be used on large organic molecules. What is less known at this point is the efficiency of the cluster beam in lifting off such molecules and the potential for the cluster to break the molecule if it hits it directly. The work presented here shows some early results from a systematic study of the desorption mechanism from a set of simulations of impact points close to and far from an adsorbed molecule. As expected the closer to the adsorbed molecule the cluster impacts the higher the probability for desorption. If the cluster impacts the adsorbed molecule it damages it as expected. However, there is a region such that the cluster does not strike the adsorbed molecule but within which the adsorbed molecule does not get desorbed, but remains intact and still bound substantially to the surface. At first sight this seems to be surprising, but the simulations show that in this region the surface of the target becomes substantially damaged and the broken surface bonds provide a strong capture site for the adsorbed molecule, bonding it more securely to the surface and "pulling" towards the impact site. An energetic particle exchange mechanism is shown in which a sputtered surface particle exchanges with an adsorbate atom in a dynamic collisional process. Descriptions of these processes and the behaviour of the size of this zone are given as a function of the initial cluster energy.
机译:分子动力学计算机模拟已用于研究高能分子或团簇撞击固体表面时发生的解吸现象。随着越来越明显的是,与更传统的单离子溅射束相比,电离颗粒的产率更高,在二次离子质谱(SIMS)中簇和分子的使用正在增长。还已经注意到,从表面喷射的完整分子离子的解吸性更高。计算机仿真已经证明了为什么会发生这种情况。团簇撞击刺激了靶表面的相关运动,从而促进了大分子物质从靶表面的温和升起。该技术在允许SIMS技术用于大型有机分子上找到了特殊的用途。在这一点上,鲜为人知的是簇束发射这种分子的效率,以及如果簇直接撞击分子,则簇破坏该分子的可能性。此处介绍的工作显示了对脱附机理的系统研究的一些早期结果,该研究是通过对一组接近和远离被吸附分子的冲击点进行的模拟得出的。不出所料,簇对团簇的影响越接近被解吸的可能性。如果团簇影响吸附的分子,它将如预期的那样对其造成损害。但是,存在这样的区域,该簇不会撞击吸附的分子,但是在该区域中,吸附的分子不会被解吸,而是保持完整并且仍然基本上与表面结合。乍看之下,这似乎令人惊讶,但是模拟表明,在该区域中,靶材的表面已受到严重破坏,断裂的表面键为吸附的分子提供了强大的捕获位点,使其更牢固地结合至表面并“拉动”。前往影响地点。显示了一种高能粒子交换机制,其中溅射的表面粒子在动态碰撞过程中与吸附原子交换。这些过程的描述以及该区域大小的行为是作为初始簇能量的函数给出的。

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