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首页> 外文期刊>Nuclear Instruments & Methods in Physics Research. B, Beam Interactions with Materials and Atoms >Differential cross-section measurements for deuteron elastic scattering on ~(nat)Si for elastic backscattering purposes
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Differential cross-section measurements for deuteron elastic scattering on ~(nat)Si for elastic backscattering purposes

机译:差分横截面测量,用于〜(nat)Si上氘核的弹性散射,用于弹性反向散射

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摘要

The differential cross sections of the Si-nat(d,d(0)) elastic scattering were determined at six backscattering angles, 120 degrees, 130 degrees, 140 degrees, 150 degrees, 160 degrees and 170 degrees. Two experiments were performed, one for the determination of the crosssection values and one for the validation of the obtained results. In the first experiment, a thin Si3N4 target with a thin layer of Au evaporated on top was bombarded with deuterons in the energy range between 1000 and 2200 keV in steps of 10 keV. In the benchmarking experiment, a thick Si [1 1 1] polished crystalline wafer target with a thin Au layer evaporated on top was irradiated with deuterons at E-dJab = 1300, 1600, 1900 and 2200 keV and at four scattering angles (130 degrees, 140 degrees, 150 degrees, 160 degrees).
机译:Si-nat(d,d(0))弹性散射的微分截面是在六个反向散射角(120度,130度,140度,150度,160度和170度)下确定的。进行了两项实验,一项用于确定横截面值,另一项用于验证所获得的结果。在第一个实验中,以10 keV的能级在1000至2200 keV之间的氘核轰击了顶部蒸发有一层Au薄层的Si3N4靶。在基准实验中,用氘核分别在E-dJab = 1300、1600、1900和2200 keV的四个散射角(130度)下照射厚的Si [1 1 1]抛光晶体晶片靶,并在其上蒸镀了一层薄Au层。 ,140度,150度,160度)。

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