White beam Laue topography using a scintillator-CCD combination

摘要

Using a scintillator-CCD imaging system, we successfully conducted a synchrotron white beam Laue topography (WBLT) experiment. It is demonstrated that this approach is able to provide a high-resolution microtopograph of p/p(+) Si (100). Optimum condition for high-resolution imaging is obtainable from the incident angle dependence of geometrical resolution. Black and white dislocation contrast suggests the potential of WBLT in characterizing dislocation structure. (c) 2005 Elsevier B.V. All rights reserved.