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首页> 外文期刊>Nuclear Instruments & Methods in Physics Research >New silicon microstrip detectors optimized for tracker alignment
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New silicon microstrip detectors optimized for tracker alignment

机译:新型硅微带探测器针对跟踪器对准进行了优化

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摘要

The resolution of tracking systems based on layers of silicon microstrips is comparable to the stability of the structures on which they are mounted. Environmental changes during operation will misalign the modules out of their nominal positions. A straight laser beam that sequentially traverses consecutive layers of microstrips can be used as an artificial track to align them. For such a laser track to reach the last sensor, high transmittance of microstrips to infrared (IR) light is needed. We have simulated the passage of a coherent beam of light through a microstrip detector and identified the minimum set of changes to the design that boosts its transmittance. The simulation has been validated against real microstrip detector samples.
机译:基于硅微带层的跟踪系统的分辨率与其安装结构的稳定性相当。操作过程中的环境变化将使模块偏离其标称位置。顺序穿过微带的连续层的直激光束可用作将它们对齐的人造轨道。为了使这样的激光轨道到达最后一个传感器,需要微带对红外(IR)光的高透射率。我们已经模拟了相干光束通过微带检测器的通道,并确定了提高设计透射率的最小变化设置。该仿真已针对实际的微带检测器样本进行了验证。

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    Institute de Fisica de Cantabria, Avda. Los Castros S/N. 39005 Santander, Spain;

    Institute de Fisica de Cantabria, Avda. Los Castros S/N. 39005 Santander, Spain;

    Institute de Fisica de Cantabria, Avda. Los Castros S/N. 39005 Santander, Spain;

    Institute de Fisica de Cantabria, Avda. Los Castros S/N. 39005 Santander, Spain;

    Centra National de Microeiectronica, Campus Universidad Autonoma de Barcelona, 08193 Bellaterra, Spain;

    Centra National de Microeiectronica, Campus Universidad Autonoma de Barcelona, 08193 Bellaterra, Spain;

    Centra National de Microeiectronica, Campus Universidad Autonoma de Barcelona, 08193 Bellaterra, Spain;

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  • 正文语种 eng
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  • 关键词

    laser hardware alignment; microstrip tracker; diffraction; interference;

    机译:激光硬件对准;微带跟踪器;衍射;干扰;

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