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Refraction driven X-ray caustics at curved interfaces

机译:弯曲界面上的折射驱动X射线碱

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摘要

X-ray refraction related interaction has received rising interest since about two decades in the field of imaging, beam shaping and analysis although being discovered a century ago. Due to refraction at interfaces in inhomogeneous media X-rays undergo natural focusing (or defocusing) of waves, revealing caustics. Such kind of intensity patterns are well-known for visible light, but have been sparsely discussed for X-rays. The variation of irradiation density may be predicted in case of known shapes. Analogously to light optics, the intensity distributions cover several orders of magnitude including complete extinction. The partly convergent (and divergent) caustic stripes originate from narrow zones of typical size of some 10(-6) of the boundary curvature radius. For the deflection of plane wave synchrotron radiation (energy in the range of some keV to some ten keV) at rods and tubes of several mu m diameter, we find good agreement between experiments and modeling by ray tracing according to Snell's law without additional diffraction contributions. Apart from basic research implications, caustics may influence the performance of irradiation technologies such as sterilization or molecular cross-linking.
机译:尽管X射线折射相关的交互作用已在一个世纪前被发现,但在成像,束成形和分析领域已经有大约二十年的历史了。由于不均匀介质中界面的折射,X射线经历了波的自然聚焦(或散焦),从而显示出焦散。对于可见光,这种强度模式是众所周知的,但是对于X射线却很少进行讨论。在已知形状的情况下,可以预测照射密度的变化。与光学类似,强度分布涵盖了几个数量级,包括完全消光。部分会聚(和发散)的苛性条带起源于典型大小约为边界曲率半径10(-6)的狭窄区域。对于直径为几微米的棒和管上的平面波同步加速器辐射(能量在keV到十keV范围内)的偏转,我们发现,根据斯涅耳定律,通过射线追踪,实验和建模之间存在良好的一致性,而无其他衍射贡献。除了基础研究的意义外,苛性碱还可能影响诸如灭菌或分子交联等辐照技术的性能。

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