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Photoelectron backscattering in the microchannel plate photomultiplier tube

机译:微通道板光电倍增管中的光电子反向散射

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摘要

The late pulse occurring in photomultiplier tubes (PMTS) is attributed to photoelectron backscattering. The small effective open area of microchannel plates (MCPs) increases the probability of photoelectrons bouncing on the front surface of MCPs and aggravates late pulses. In this work, a three-dimensional MCP-PMT model is developed in CST particle studio, a powerful electromagnetic field simulation program, to evaluate the effects of secondary emission yield (SEY) property of the MCP input facet and electric field on the photoelectron backscattering. Timing properties and the number of collected electrons are extracted without smearing due to electronic noise and finite pulse width. Results predict that the collection efficiency (CE) and the time performance can be improved by coating the MCP Nickel-Chromium input electrode with a high SEY material and operating in a proper photocathode-MCP bias voltage. (C) 2017 Elsevier B.V. All rights reserved.
机译:在光电倍增管(PMTS)中出现的迟脉冲归因于光电子反向散射。微通道板(MCP)的有效有效开口面积较小,会增加光电子在MCP正面反弹的可能性,并加重后期脉冲。在这项工作中,在强大的电磁场模拟程序CST Particle Studio中开发了三维MCP-PMT模型,以评估MCP输入面的二次发射产率(SEY)特性和电场对光电子反向散射的影响。由于电子噪声和有限的脉冲宽度,可以提取定时特性和收集的电子数而不会产生拖尾现象。结果表明,通过用高SEY材料涂覆MCP镍铬输入电极并在适当的光电阴极-MCP偏置电压下工作,可以提高收集效率(CE)和时间性能。 (C)2017 Elsevier B.V.保留所有权利。

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