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Stress-induced hydrogen self-trapping in tungsten

机译:钨中应力诱导的氢自陷

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The molecular dynamics simulations of trapping of hydrogen atoms in tungsten are presented. The simulations reveal formation of platelet-like structures of self-trapped hydrogen induced by stresses in tungsten, in particular, those produced by dislocations, at the interstitial hydrogen concentrations similar to 0.3 - 1 at.%. The spontaneous hydrogen platelet formation in absence of dislocations and external stresses has been also observed at the higher hydrogen concentrations similar to 10 at.%. It is shown that the platelets can retain substantial quantities of hydrogen, exceeding trapping capacity of other non-cavity defects in tungsten. The properties of the hydrogen platelets formed in tungsten under various conditions are assessed and a formation mechanism is proposed. A model of hydrogen retention by the dislocation-induced structures is also presented, which describes retained quantities and outgassing dynamics of hydrogen in plasma exposed tungsten samples.
机译:提出了在钨中捕获氢原子的分子动力学模拟。模拟结果表明,在间隙氢浓度接近0.3-1 at。%的情况下,钨中的应力(尤其是位错产生的应力)诱发了自陷氢的片状结构的形成。在较高的氢浓度(类似于10 at。%)下,也观察到了无位错和外部应力的自发氢血小板形成。结果表明,血小板可以保留大量的氢,超过了钨中其他非空穴缺陷的捕获能力。评价了在各种条件下在钨中形成的氢血小板的性质,并提出了形成机理。还提出了一种由位错诱导的结构保留氢的模型,该模型描述了等离子体暴露的钨样品中氢的保留量和除气动力学。

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