A wall-thickness-based method of adaptive Integration time determination for X-ray computed tomography

摘要

This paper introduces a method to reduce the acquisition time of X-ray computed tomography (XCT) scanners with line detectors. For every slice (cross-sectional image), the maximum wall thickness (WT) of an object is calculated. WT and signal-to-noise ratio (SNR) of the XCT detector signal correlate for a defined integration time. So it is possible to determine an adapted integration time from WT for every slice plane using a constant SNR. WT calculation makes use of CAD files in STL format. The reduction in acquisition time depends on the parameters of the XCT system as well as on the geometry of the object that has to be scanned. First tests applying the method on STL meshes show a reduction in acquisition time up to 70 percent.