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Merging experiments and computer simulations in X-ray Computed Tomography probability of detection analysis of additive manufacturing flaws

机译:合并X射线计算断层摄影概率的实验和计算机仿真对添加剂制造缺陷的检测分析概率

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摘要

X-ray Computed Tomography (XCT) is a growing industrial non-destructive testing (NDT) technique for advanced manufacturing industries such as additive manufacturing (AM). Probability of detection (POD) is a critical aspect for qualifying NDT techniques/processes. We present a methodology to empirically determine XCT POD using a two-piece phantom, and which incorporates uncertainty in the measurements of the true flaw size in the phantoms. We additionally demonstrate an application of an XCT full simulation model using simulated phantoms to supplement the experimental measurements. A signal response POD analysis (a vs a) was implemented, where the signal response (a) was the number of voxels determined to be in the flaw, and the true flaw sizes (a) were the measured volumes of the flaws. Phantoms with flaws representing AM lack of fusion (LOF) pores were developed and were measured with an optical measurement system allowing the quantification of uncertainty in the measurement of the true flaw size (a). The XCT simulations considered factors not assessed by the experimental measurements. The simulated phantoms have various flaw sizes, locations, and orientations. The XCT simulation results were integrated with the experimental results using a multi-level Bayesian model, which incorporated the effects of reference measurement uncertainty, imaging thresholds, and flaw locations and orientations.
机译:X射线计算机断层扫描(XCT)是一种越来越多的工业无损检测(NDT)技术,用于高级制造业,如添加剂制造(AM)。检测概率(POD)是用于限定NDT技术/过程的关键方面。我们介绍了一种方法来使用两件式幻影经验地确定XCT荚,并且在幻影中的真正缺陷尺寸的测量中结合了不确定性。另外,使用模拟幻像展示XCT全仿真模型的应用,以补充实验测量。实现了信号响应POD分析(VS A),其中信号响应(a)是确定为缺陷的体素数,并且真正的缺陷尺寸(a)是缺陷的测量体积。具有代表缺乏融合(LOF)孔的瑕疵的幻影并用光学测量系统测量,允许在真正缺陷(a)的测量中定量不确定性。 XCT模拟认为实验测量未评估的因素。模拟的幽灵具有各种缺陷尺寸,位置和方向。 XCT仿真结果与使用多级贝叶斯模型的实验结果集成,该模型结合了参考测量不确定性,成像阈值和缺陷位置和方向的影响。

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