Non-Destructive Evaluation (NDE) of Structures Using Transient and Lock-in Thermography

摘要

Researchers at NASA's Johnson Space Center improved their Flash Thermography capabilities by incorporating transient and lock-in thermography. By adding the transient thermography method that detects flaws on thicker parts faster than other methods, and the lock-in thermography method that uses a sinusoidal power cycle to provide a better flaw resolution, the Flash Thermography NDE Technology Suite has expanded its applicability to other commonly used infrared thermography techniques.