Using van der Pauw and microwave surface resi stance measurements, a seri es of temperature-dependent data sets from carbon nanotube (C NT) thin fi I ms have been measured. The test structures were fabricated using photolithography, E -beam evaporation, and a novel CNT network deposition technique. The sheet resistance and resistivity of each sample were recorded at temperatures ranging from 0-60 °C with test currents ranging from 100 nA to 100 (μA. These val ues demonstrated excellent 1 inearity, with no dependence on currents. At room temperature, the sheet resistance yielded a negative temperature coefficient (of approximately-900 ppm/℃). Our objective is to analyze the effect that DC and microwave currents have on CNT thin films using a twopoint measurement technique on Corbi no discs and in the presence of microwaves (8-12 GHz) to determi ne at which temperatures a CNT thin film performs best and identify the ideal temperature range in which a CNT microchip yields the maxi mi zed sheet resi stance. The results counter the trend found by the four-point measurements; a positive temperature coefficient was observed. This observation indicates the temperature coefficient of the material is actually dependent on the size of the sample tested.
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