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Contrast X-ray powder diffraction of solid rare gas nanocrystals in silica gel mesopores

机译:硅胶中孔中固体稀有气体纳米晶体的X射线粉末对比衍射

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摘要

Nanocrystals of Kr and Xe have been prepared by condensing the rare gas into the mesopores of dry silica gel with specified pore diameters of 22, 40, 60, and 100 A, and their X-ray powder diffractograms are reported. In the small angle range the scattering intensity was reduced by 70-98% since the electron densities of these rare gas solids and of SiO_2 nearly match. This allows one to monitor the degree of pore filling. In the wide angle range some additional scattering intensity appears from the solid rare gases, and this was separated from the underlying silica gel diffractogram. All features of the solids in the pores are broadened considerably with respect to the patterns of the respective extended crystals. The broadening increases with decreasing pore size, the diffractogram of Kr in silica gel 22 being similar to those of amorphous solids. Diffraction patterns of Kr and Xe clusters calculated with appropriate geometries and degrees of disorder reproduce the experimental data. The dimensions of these clusters and the specified mean pore diameters of the respective silica gels match very well. The measurement of the X-ray contrast in the wide range should provide a powerful complementary approach to porosimetry.
机译:Kr和Xe的纳米晶体是通过将稀有气体冷凝到具有22、40、60和100 A特定孔径的干燥硅胶的介孔中而制得的,据报道它们的X射线粉末衍射图。在小角度范围内,散射强度降低了70-98%,因为这些稀有气体固体和SiO_2的电子密度几乎匹配。这使得人们可以监测孔的填充程度。在广角范围内,固体稀有气体会产生一些额外的散射强度,这与下面的硅胶衍射图是分开的。孔中固体的所有特征相对于各自延伸的晶体的图案都显着扩大。随着孔径的减小,增宽增加,硅胶22中Kr的衍射图类似于无定形固体的衍射图。用适当的几何形状和无序度计算出的Kr和Xe团簇的衍射图样再现了实验数据。这些簇的尺寸和各个硅胶的规定平均孔径非常匹配。在宽范围内测量X射线对比度应为孔隙率测定提供强有力的补充方法。

著录项

  • 来源
    《Molecular physics》 |1996年第4期|p.1057-1070|共14页
  • 作者单位

    Fachbereich Chemie der Universitaet Siegen, D-57068 Siegen, Germany;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 分子物理学;
  • 关键词

  • 入库时间 2022-08-18 01:08:08

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