Computing Risk of Pyrotechnic Devices Using Lot Acceptance Testing

摘要

This paper presents an application of statistical engineering to solve the problem of determining the effects of reducing test sample sizes and environment levels in lot acceptance testing (LAT) of ordnance devices used by NASA and Department of Defense space systems. Unlike environmental testing of dedicated qualification hardware, ordnance devices have a test-like-you-fly exception and use lot acceptance sampling or LAT. LAT is performed by randomly selecting a predefined number of devices from an individual lot and exposing them to a more severe dynamic shock and vibration testing environments than flight (sometimes as high as six decibels over flight environments) and then performing a destructive test on the device. Recent trends have been suggested to reduce LAT costs by reducing environment test levels or the number of devices per LAT, or both. A method is given here to compute flight risk, so the proposed methods can be compared by subject matter experts to the baseline LAT methods. In addition, this method can be used to determine the best methods to include in future LAT standards for pyrotechnic devices.