Test-Fixture for Suspended-Strip Gap-Waveguide Technology on Ka-Band

摘要

This letter presents a Test-Fixture for a Suspended-Strip Gap-Waveguide technology that provides a fast measurement system for the prototyping stage. For this purpose, a transition from standard rectangular waveguide to this new technology has been developed. A TRL kit and a repeatability study have been made to ensure the reliability of the process, and several straightforward circuits have been manufactured and measured.