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On the use of embedded debug features for permanent and transient fault resilience in microprocessors

机译:关于使用嵌入式调试功能实现微处理器中永久性和瞬时性故障恢复的信息

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摘要

Microprocessor-based systems are employed in an increasing number of applications where dependability is a major constraint. For this reason detecting faults arising during normal operation while introducing the least possible penalties is a main concern. Different forms of redundancy have been employed to ensure error-free behavior, while error detection mechanisms can be employed where some detection latency is tolerated. However, the high complexity and the low observability of microprocessors' internal resources make the identification of adequate on-line error detection strategies a very challenging task, which can be tackled at circuit or system level. Concerning system-level strategies, a common limitation is in the mechanism used to monitor program execution and then detect errors as soon as possible, so as to reduce their impact on the application. In this work, an on-line error detection approach based on the reuse of available debugging infrastructures is proposed. The approach can be applied to different system architectures profiting from the debug trace port available in most of current microprocessors to observe possible misbehaviors. Two microprocessors have been used to study the applicability of the solution, LE0N3 and ARM7TDM1. Results show that the presented fault detection technique enhances observability and thus error detection abilities in microprocessor-based systems without requiring modifications on the core architecture.
机译:基于微处理器的系统被用于越来越多的以可靠性为主要制约因素的应用中。因此,主要的问题是在正常操作过程中发现故障,同时尽可能减少损失。已经采用了不同形式的冗余来确保无错误行为,而可以在容忍某些检测等待时间的地方采用错误检测机制。然而,微处理器内部资源的高复杂性和低可观察性使得识别足够的在线错误检测策略成为一项非常具有挑战性的任务,可以在电路或系统级别解决。对于系统级策略,一个共同的限制是用于监视程序执行然后尽快检测错误的机制,以减少它们对应用程序的影响。在这项工作中,提出了一种基于重用可用调试基础结构的在线错误检测方法。该方法可以应用于不同的系统体系结构,这得益于大多数当前微处理器中可用的调试跟踪端口,以观察可能的不良行为。已经使用两个微处理器LE0N3和ARM7TDM1研究该解决方案的适用性。结果表明,所提出的故障检测技术增强了可观察性,从而提高了基于微处理器的系统中的错误检测能力,而无需修改核心体系结构。

著录项

  • 来源
    《Microprocessors and microsystems》 |2012年第5期|p.334-343|共10页
  • 作者单位

    University Carlos III of Madrid, C/Butarque, 15, Leganes 28911, Spain;

    Politecmco di Torino, Corso Duca degli Abruzzi, 24, Torino 10129, Italy;

    University Carlos III of Madrid, C/Butarque, 15, Leganes 28911, Spain;

    Politecmco di Torino, Corso Duca degli Abruzzi, 24, Torino 10129, Italy;

    University Carlos III of Madrid, C/Butarque, 15, Leganes 28911, Spain;

    University Carlos III of Madrid, C/Butarque, 15, Leganes 28911, Spain;

    University Carlos III of Madrid, C/Butarque, 15, Leganes 28911, Spain;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    error detection; debug infrastructure; on-line test;

    机译:错误检测;调试基础架构;在线测试;

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