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首页> 外文期刊>Microelectronics journal >A 10-bit 300-MS/s asynchronous SAR ADC with strategy of optimizing settling time for capacitive DAC in 65 nm CMOS
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A 10-bit 300-MS/s asynchronous SAR ADC with strategy of optimizing settling time for capacitive DAC in 65 nm CMOS

机译:一个10位300-MS / s异步SAR ADC,具有优化65 nm CMOS中电容DAC的建立时间的策略

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摘要

A 10-bit 300-MS/s asynchronous SAR ADC in 65 nm CMOS is presented in this paper. To achieve low power, binary-weighed capacitive DAC is employed without any digital correction or calibration. Consequently, settling time for the capacitive DAC would be a dominant limiting factor for the ADC operating speed. A novel architecture is proposed to optimize the settling time for the capacitive DAC, which depends merely on the on-resistance of switches and the capacitance of unit capacitor and irrelevant to the resolution. Therefore, high-speed high-resolution SAR ADC is possible. What is deserved to highlight is that the architecture improves the ADC performance at a fraction of the cost, with only some capacitors and control logic added. Post-layout simulation has been made for the SAR ADC. At a 1.2-V supply voltage and a sampling rate of 300 MS/s, it consumes 1.27 mW and achieves an SNDR of 60 dB, an SFDR of 67.5 dB, with the Nyquist input. The SAR ADC occupies a core area of 450 x 380 mu m(2). (C) 2015 Elsevier Ltd. All rights reserved.
机译:本文介绍了一种采用65 nm CMOS的10位300-MS / s异步SAR ADC。为了实现低功耗,采用了二进制称量的容性DAC,而无需进行任何数字校正或校准。因此,电容式DAC的建立时间将是ADC工作速度的主要限制因素。提出了一种新颖的架构来优化电容DAC的建立时间,该建立时间仅取决于开关的导通电阻和单位电容器的电容,而与分辨率无关。因此,高速高分辨率SAR ADC是可能的。值得强调的是,该架构仅需增加一些电容器和控制逻辑,即可以很少的成本提高ADC性能。 SAR ADC进行了布局后仿真。在1.2V电源电压和300MS / s的采样率下,它的奈奎斯特输入功耗为1.27mW,SNDR为60dB,SFDR为67.5dB。 SAR ADC的核心区域为450 x 380μm(2)。 (C)2015 Elsevier Ltd.保留所有权利。

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