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首页> 外文期刊>Microelectronics journal >A Low-Power Low-Noise Monolithic Accelerometer with Automatic Sensor Offset Calibration
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A Low-Power Low-Noise Monolithic Accelerometer with Automatic Sensor Offset Calibration

机译:具有自动传感器偏移校准的低功耗低噪声单片加速度计

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摘要

This work presents a monolithically integrated CMOS-MEMS capacitive accelerometer that uses background self-calibration in analog mode to compensate for sensor offset. Background analog calibration maintains sensor accuracy at all times, thus improving upon traditional digital calibration methods. When powered on, the calibration process automatically initiates without the need for an external controller like a microcontroller. The design requires no physical trimming techniques on the MEMS structure, and the worst zero-gram offset can be reduced to +/- 50 mg. The single-axis accelerometer was fabricated by the UMC 0.18 mu m CMOS-MEMS process. The chip area containing the sensors and the integrated circuit is 1.94 mm x 1.23 mm. Within the sensing range of +/- 8 g, the measured output noise density is around 100 mu g/rtHz. This total power consumption from the 1.8 V supply voltage is 45 mu W.
机译:这项工作介绍了一种单片集成的CMOS-MEMS电容式加速度计,用于在模拟模式下进行背景自校验来补偿传感器偏移。 背景技术模拟校准随时保持传感器精度,从而改善了传统的数字校准方法。 电源打开时,校准过程会自动启动,而无需像微控制器那样需要外部控制器。 设计不需要在MEMS结构上进行物理修整技术,并且最差的零克偏移可以减少到+/- 50mg。 通过UMC0.18μMCMOS-MEMS过程制造单轴加速度计。 包含传感器和集成电路的芯片区域为1.94 mm x 1.23 mm。 在+/- 8g的感测范围内,测量的输出噪声密度约为100μg/ rthz。 1.8 V电源电压的总功耗为45亩。

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