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首页> 外文期刊>Microchimica Acta >Virtual standard for wavelength-dispersive electron-probe microanalysis
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Virtual standard for wavelength-dispersive electron-probe microanalysis

机译:波长色散电子探针微分析的虚拟标准

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摘要

A calibration method aimed at converting X-ray intensities into absolute units has been tested in different electron microprobes. The calibration requires measurement of the X-ray peak profile and measurement and calculation of the bremsstrahlung intensity emitted from a reference sample, at the energy of the X-ray line of interest. Specifically, measurements of the U Mα and Mβ lines emitted from UO2 and bremsstrahlung intensities emitted from an Al reference sample have been performed on five different instruments. The aim of the work is to determine to what accuracy X-ray intensities emitted from reference samples of actinide elements are transferable among different electron microprobes (virtual standard). The influence of the focussing geometry and different crystals and proportional counters used is analysed. Strategies to reduce the uncertainties affecting the absolute calibration of the studied lines are discussed.
机译:旨在将X射线强度转换为绝对单位的校准方法已经在不同的电子微探针中进行了测试。校准需要在感兴趣的X射线线的能量下测量X射线峰轮廓,并测量和计算从参考样品发出的bre致辐射强度。具体而言,已经在五种不同的仪器上对从UO 2 发出的UMα和Mβ线以及从Al参考样品发出的致辐射强度进行了测量。这项工作的目的是确定从act系元素的参考样品发出的X射线强度在不同的电子微探针(虚拟标准)之间可转移的精度。分析了聚焦几何形状以及所使用的不同晶体和比例计数器的影响。讨论了减少影响研究线路绝对校准的不确定性的策略。

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