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首页> 外文期刊>Mechanics of materials >Shielding or anti-shielding effects of solute hydrogen near a finite length crack: A new possible mechanism of hydrogen embrittlement
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Shielding or anti-shielding effects of solute hydrogen near a finite length crack: A new possible mechanism of hydrogen embrittlement

机译:有限长度裂纹附近的溶质氢的屏蔽或抗屏蔽作用:氢脆的一种新的可能机理

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摘要

A two-dimensional elastic solution for the stress field of a dilatation line near an elliptical void in an infinite matrix is obtained. The dilatation line is used to represent a row of equally spaced solute atoms. This elastic solution is employed to study the shielding or anti-shielding effect of solute atoms near a finite length crack. The stress intensity factor of stress field induced by a dilatation line is analytically obtained. It is shown that whether solute atoms have a shielding or anti-shielding effect on the crack tips depends on the position of solute atoms. An equaling zero curve is defined, on which the solute dilatation line induces zero Mode I stress intensity factor at the crack-tip. It is found that the shape of equaling zero curve is independent of any model parameters. The shielding and anti-shielding effects of a lot of solute hydrogen (hydrogen atmospheres) are studied through an integral scheme. The hydrogen concentration field is assumed to equilibrate with external or internal stress fields. We consider two cases. One case is that an externally uniaxial load in the direction vertical to crack is applied. Another case is that there exists an edge dislocation near crack. Based on these studies, a new possible mechanism of hydrogen embrittlement is proposed, which can be referred to as hydrogen induced anti-shielding crack mechanism.
机译:获得了无限矩阵中椭圆形空隙附近膨胀线应力场的二维弹性解。膨胀线用于表示一排等距的溶质原子。该弹性溶液用于研究有限长度裂纹附近的溶质原子的屏蔽或抗屏蔽作用。解析得到由膨胀线引起的应力场的应力强度因子。结果表明,溶质原子对裂纹尖端具有屏蔽作用还是抗屏蔽作用取决于溶质原子的位置。定义了一条相等的零曲线,在该曲线上,溶质膨胀线在裂纹尖端引起零的I型应力强度因子。发现零曲线的形状与任何模型参数无关。通过积分方案研究了许多溶质氢(氢气氛)的屏蔽和抗屏蔽作用。假定氢浓度场与外部或内部应力场平衡。我们考虑两种情况。一种情况是在垂直于裂纹的方向上施加外部单轴载荷。另一种情况是裂纹附近存在边缘错位。基于这些研究,提出了一种新的可能的氢脆机理,可以称为氢诱导的抗屏蔽裂纹机理。

著录项

  • 来源
    《Mechanics of materials》 |2019年第5期|109-120|共12页
  • 作者单位

    Huazhong Univ Sci & Technol, Dept Mech, Wuhan 430074, Hubei, Peoples R China|Hubei Key Lab Engn Struct Anal & Safety Assessmen, Luoyu Rd 1037, Wuhan 430074, Hubei, Peoples R China;

    Huazhong Univ Sci & Technol, Dept Mech, Wuhan 430074, Hubei, Peoples R China|Hubei Key Lab Engn Struct Anal & Safety Assessmen, Luoyu Rd 1037, Wuhan 430074, Hubei, Peoples R China;

    Huazhong Univ Sci & Technol, Dept Mech, Wuhan 430074, Hubei, Peoples R China|Hubei Key Lab Engn Struct Anal & Safety Assessmen, Luoyu Rd 1037, Wuhan 430074, Hubei, Peoples R China;

    Huazhong Univ Sci & Technol, Dept Mech, Wuhan 430074, Hubei, Peoples R China|Hubei Key Lab Engn Struct Anal & Safety Assessmen, Luoyu Rd 1037, Wuhan 430074, Hubei, Peoples R China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Hydrogen embrittlement; Crack; Shielding/anti-shielding effects; Cottrell atmospheres; Dislocation;

    机译:氢脆;裂纹;屏蔽/抗屏蔽作用;Cottrell气氛;位错;

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