ELECTRICAL METHODS OF MONITORING AND STRENGTHENING ELECTRON DEVICES

摘要

The conditions for resonance oscillations of the current and the electromagnetic field to occur in metal-dielectric-metal structures when acted upon by a constant external electric field are determined, taking into account the electron emission in the dielectric from microprotuberances on the surface of the metal electrodes. A physical model of self-excited wave processes which occur in the initial reversible stage of electric breakdown of a thin dielectric layer is formulated.