THE EFFECT OF FOCUSING ON THE LATERAL RESOLUTION OF AN INTERFERENCE MICROSCOPE

G. G. Levin; N. N. Moiseev; Ya. A. Ilyushin; V. L. Minaev

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THE EFFECT OF FOCUSING ON THE LATERAL RESOLUTION OF AN INTERFERENCE MICROSCOPE

机译：聚焦对干涉显微镜横向分辨率的影响

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摘要

The dependence of the lateral resolution of an interference microscope on the distance between the phase step and the focal plane of the objective of the microscope object channel is analyzed. The results of measurements at several wavelengths, obtained by numerical modeling over a wide range of heights of the phase step and by processing actual phase images, are compared.

机译：分析了干涉显微镜的横向分辨率对相位步距与显微镜物镜物镜的焦平面之间距离的依赖性。比较了在多个波长上的测量结果，这些结果是通过在较大范围的阶跃高度上进行数值建模并通过处理实际的相位图像获得的。

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来源
《Measurement techniques》 |2014年第1期|69-73|共5页
作者
G. G. Levin; N. N. Moiseev; Ya. A. Ilyushin; V. L. Minaev;
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作者单位

All-Russia Research Institute of Optophysical Measurements (VNIIOFI), Moscow, Russia;

All-Russia Research Institute of Optophysical Measurements (VNIIOFI), Moscow, Russia;

All-Russia Research Institute of Optophysical Measurements (VNIIOFI), Moscow, Russia;

All-Russia Research Institute of Optophysical Measurements (VNIIOFI), Moscow, Russia;

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收录信息美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
原文格式 PDF
正文语种 eng
中图分类
关键词
interference microscope; lateral resolution; phase step; the method finite differences in time;

机译：干涉显微镜横向分辨率相阶该方法在时间上的有限差异;
入库时间 2022-08-17 13:11:11

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1. A COMPARISON OF THE LATERAL RESOLUTIONS OF OPTICAL AND INTERFERENCE MICROSCOPES [J] . G. G. Levin, N. N. Moisecv, V. L. Minaev, Measurement techniques . 2013,第9期

机译：光学和干涉显微镜横向分辨率的比较
2. THE LATERAL RESOLUTION OF AN INTERFERENCE MICROSCOPE [J] . G. G. Levin, G. N. Vishnyakov, N. N. Moiseev, Measurement techniques . 2013,第5期

机译：干涉显微镜的横向分辨率
3. Nanometric light spots of cathode luminescence in Y₂O₃:Eu3+ phosphor thin films excited by focused electron beams as ultra-small illumination source for high-resolution optical microscope [J] . Atsushi Sugita, Masashi Kamiya, Chiyu Morita, Optical Materials Express . 2014,第1期

机译：聚焦电子束激发的Y _{2 O _{3 ：Eu 3 + 荧光粉薄膜中阴极发光的纳米光斑用于高分辨率光学显微镜}}
4. DETERMINATION OF THE LATERAL RESOLUTION OF AN INTERFERENCE MICROSCOPE USING A MICRO-SCALE SPHERE [C] . Rong Su, Matthew Thomas, Peter de Groot, 33rd ASPE annual meeting 2018 . 2018

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5. Darkfield imaging with a plasmonic focusing lens: Antenna theory for near-field scanning optical microscopes. [D] . Tang, Japeck. 2009

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机译：使用聚焦离子束扫描电子显微镜（FIB-SEM）和3Mv超高压电子显微镜（UHVEM）层析成像技术在全细胞水平上对纳米粒子的有丝分裂进行三维微观结构可视化
8. Modeling a Miniaturized Scanning Electron Microscope Focusing Column - Lessons Learned in Electron Optics Simulation. [R] . Loyd, J., Gregory, D., Gaskin, J. 2016

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THE EFFECT OF FOCUSING ON THE LATERAL RESOLUTION OF AN INTERFERENCE MICROSCOPE

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