ESTIMATE OF THE EXPANDED UNCERTAINTY IN THE RESULT OF MEASURING THE SHORT CIRCUIT CURRENT OF THIN-FILM PHOTOVOLTAIC MODULES

摘要

The sources of uncertainty in measurements of the short circuit current of thin film photovoltaic modules are analyzed. An Ishikawa diagram is developed to represent the main sources of uncertainty when a pulsed solar radiation simulator is used. The expanded combined uncertainty in the result of measuring the short circuit current is calculated taking these sources into account.