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Analysis of Factors Affecting the Accuracy of Three-Dimensional Reconstruction of the Surface of Objects with Submicrometer Relief Obtained by Scanning Electron Microscope Stereo Images

机译:扫描电子显微镜立体图像获得的亚微米级浮雕对物体表面三维重建精度影响因素的分析

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摘要

We present analysis results of factors influencing the systematic error in 3-D reconstruction of surface reliefs based on stereo images obtained using the scanning electron microscope S-4800. The typical size for the surface relief elements is less than 1 mu m. The main sources of the error are found. It is shown that for typical samples the main factor influencing the systematic error of 3-D reconstruction is the parallax measurement error.
机译:我们基于使用扫描电子显微镜S-4800获得的立体图像,介绍影响表面浮雕的3D重建中系统误差的因素的分析结果。表面起伏元件的典型尺寸小于1微米。找到错误的主要来源。结果表明,对于典型样本,影响3-D重建系统误差的主要因素是视差测量误差。

著录项

  • 来源
    《Measurement techniques》 |2016年第3期|230-234|共5页
  • 作者单位

    All Russia Res Inst Metrol Serv VNIIMS, Moscow, Russia;

    Natl Res Ctr Kurchatov Inst, Moscow, Russia|Russian Acad Sci, Inst Crystallog, Moscow, Russia;

    Res Ctr Study Properties Surfaces & Vacuum NITsPV, Moscow, Russia;

    Natl Res Ctr Kurchatov Inst, Moscow, Russia;

    Res Ctr Study Properties Surfaces & Vacuum NITsPV, Moscow, Russia|State Univ, Moscow Inst Phys & Technol, Dolgoprudnyi, Moscow Oblast, Russia;

    Res Ctr Study Properties Surfaces & Vacuum NITsPV, Moscow, Russia|State Univ, Moscow Inst Phys & Technol, Dolgoprudnyi, Moscow Oblast, Russia;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    scanning electron microscope (SEM); stereo images; 3-D surface reconstruction; submicron relief;

    机译:扫描电子显微镜(SEM);立体图像;3-D表面重建;亚微米浮雕;
  • 入库时间 2022-08-17 13:11:02

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