首页> 外文期刊>Materials Science and Engineering. B, Solid-State Materials for Advanced Technology >The effects of CeO_2-doping on piezoelectric and dielectric properties of Bi_(0.5)(Na_(1-x-y)K_xLi_y)_(0.5)TiO_3 piezoelectric ceramics
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The effects of CeO_2-doping on piezoelectric and dielectric properties of Bi_(0.5)(Na_(1-x-y)K_xLi_y)_(0.5)TiO_3 piezoelectric ceramics

机译:CeO_2掺杂对Bi_(0.5)(Na_(1-x-y)K_xLi_y)_(0.5)TiO_3压电陶瓷压电和介电性能的影响

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摘要

CeO_2-doped Bi_(0.5)(Na_(1-x-y)K_xLi_y)_(0.5)TiO_3 lead-free piezoelectric ceramics were prepared by solid-state reaction processes. X-ray diffraction (XRD) data show that the ceramics possess pure perovskite phase. SEM images indicate that a small amount of CeO_2 affects the microstructure. The electrical properties of Bi_(0.5)(Na_(0.725)K_(0.175)Li_(0.1))_(0.5)TiO_3 ceramics have been greatly improved by doping of certain amount of CeO_2. The temperature dependence of the dielectric constant and dissipation factor reveals that the transition temperature from ferroelectric to anti-ferroelectric phases (T_f) decreases with the addition of CeO_2. At room temperature, the ceramics doped with 0.1 wt% CeO_2 show quite good performance with high piezoelectric constant (d_(33) = 220 pC/N), high coupling factor (k_p = 39.3%,), enhanced dielectric constant (ε_r = 897) and low dissipation factor (tan δ = 2.0%) at 1 kHz, which indicates that CeO_2-doping possesses both effects of increasing the piezoelectric properties and decreasing the dissipation factor of the ceramics.
机译:通过固相反应法制备了CeO_2掺杂Bi_(0.5)(Na_(1-x-y)K_xLi_y)_(0.5)TiO_3无铅压电陶瓷。 X射线衍射(XRD)数据表明陶瓷具有纯钙钛矿相。 SEM图像表明少量的CeO_2影响微观结构。通过掺杂一定量的CeO_2可以极大地改善Bi_(0.5)(Na_(0.725)K_(0.175)Li_(0.1))_(0.5)TiO_3陶瓷的电学性能。介电常数和耗散因数的温度依赖性表明,随着CeO_2的添加,铁电相到反铁电相的转变温度(T_f)降低。在室温下,掺有0.1 wt%CeO_2的陶瓷在高压电常数(d_(33)= 220 pC / N),高耦合系数(k_p = 39.3%)和增强的介电常数(ε_r= 897)方面表现出相当好的性能。 )和低耗散因数(tanδ= 2.0%)在1 kHz时,表明CeO_2掺杂具有提高压电性能和降低陶瓷耗散因数的作用。

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