首页> 外文期刊>Materials Science and Engineering. A, Structural Materials >Overcoming the effect of contaminant in solid oxide fuel cell (SOFC) electrolyte: spark plasma sintering (SPS) of 0.5 wt. Percent silica-doped yttria-stabilized zirconia (YSZ)
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Overcoming the effect of contaminant in solid oxide fuel cell (SOFC) electrolyte: spark plasma sintering (SPS) of 0.5 wt. Percent silica-doped yttria-stabilized zirconia (YSZ)

机译:克服固体氧化物燃料电池(SOFC)电解质中污染物的影响:0.5 wt。%的火花等离子体烧结(SPS)。二氧化硅掺杂的氧化钇稳定的氧化锆百分比(YSZ)

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The alleviation of SiO_2 as contaminant in SOFC electrolyte was studied through spark plasma sintering (SPS) of yttria-stabilized zirconia (YSZ) doped with approx 0.5 wt. percent SiO_2. The outcome of variations in SPS process conditions such as sintering temperature, duration, and applied pressure on the grain boundary and grain interior resistivity of silica-doped YSZ electrolyte was studied with ac impedance spectroscopy. Results show that the apparent grain boundary resistivity of SPS-processed silica-containing YSZ electrolyte is moderately higher than that of pure YSZ electrolyte, but it was significantly lower than that of silica-containing YSZ electrolyte prepared by conventional sintering. A linear correlation was observed between relative density and grain interior resistivity, no matter what sintering method or starting powder was adopted. Furthermore, the apparent grain boundary resistivity was found to be strongly dependent on the grain size and the effective conducting area of the grain boundary. Results showed that SPS was an efficacious powder consolidation method, and it could effectively shorten the sintering duration down to several minutes. It was also found to significantly reduce the grain boundary resistivity without detrimental consequence on the grain interior resistivity. This raised the prospect of scavenging the detrimental effects of contaminants in SOFC electrolyte through SPS processing.
机译:通过掺杂约0.5 wt。%的氧化钇稳定的氧化锆(YSZ)的火花等离子体烧结(SPS)研究了SOFC电解质中SiO_2作为污染物的缓解方法。 SiO 2百分比。利用交流阻抗谱研究了SPS工艺条件的变化结果,例如烧结温度,持续时间,施加压力的掺杂硅的YSZ电解质的晶界和晶粒内部电阻率。结果表明,经SPS处理的含二氧化硅的YSZ电解质的表观晶界电阻率适度高于纯YSZ电解质的表观晶界电阻率,但显着低于通过常规烧结制备的含二氧化硅的YSZ电解质的表观晶界电阻率。无论采用哪种烧结方法或起始粉末,都可以观察到相对密度与晶粒内部电阻率之间存在线性关系。此外,发现表观晶界电阻率很大程度上取决于晶粒尺寸和晶界的有效导电面积。结果表明,SPS是一种有效的粉末固结方法,可以有效地将烧结时间缩短至几分钟。还发现它显着降低了晶界电阻率,而对晶粒内部电阻率没有不利影响。这就提出了通过SPS处理消除SOFC电解质中污染物的有害影响的前景。

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