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Transparent conductive Tb-doped ZnO films prepared by rf reactive magnetron sputtering

机译:射频反应磁控溅射制备透明掺杂T的ZnO薄膜

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Terbium-doped Zinc oxide (ZnO: Tb) films were prepared by rf reactive magnetron sputtering using a Zn target with some Tb-chips attached. The structural, electrical, and optical properties of the films were investigated by X-ray diffraction (XRD), Hall measurement and optical spectroscopy, respectively. The resistivity of 9.34 x 10~4 ft cm was obtained in ZnO:Tb films prepared on a Si substrate at a temperature of 250 deg C with a Tb content of 4.1 percent. The transparent edges of the films showed blue-shifts with the average transmittance within the visible range being up to 85 percent. The results to date demonstrate that Tb-doped ZnO films are high-quality transparent conductive oxide materials.
机译:r掺杂的氧化锌(ZnO:Tb)膜是通过使用锌靶材并附有一些Tb芯片的射频反应磁控溅射制备的。薄膜的结构,电学和光学性质分别通过X射线衍射(XRD),霍尔测量和光谱学研究。在250℃,Tb含量为4.1%的情况下,在Si衬底上制备的ZnO:Tb膜中获得的电阻率为9.34 x 10〜4 ft cm。薄膜的透明边缘出现蓝移,可见光范围内的平均透射率高达85%。迄今为止的结果表明,掺Tb的ZnO薄膜是高质量的透明导电氧化物材料。

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