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Grain size effect of V-shaped multiple twins in annealed nanocrystalline Cu

机译:退火纳米晶Cu中V形多晶的晶粒尺寸效应

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摘要

V-shaped multiple twins have been observed in annealed nanocrystalline Cu by high-resolution transmission electron microscopy. The density of V-shaped multiple twins depends on the grain size remarkably. With decreasing grain size, the amount of V-shaped multiple twins increases initially and then decreases, reaching the maximum at a critical grain size of 40 nm and exhibiting an obvious grain size dependence. The formation mechanism of V-shaped multiple twins is proposed based on cooperative grain rotation and grain boundary migration. However, the amount of V-shaped multiple twins decreases significantly below the critical grain size, which is attributed to the grain rotation-mediated single crystal growth. (C) 2015 Elsevier B.V. All rights reserved.
机译:通过高分辨率透射电子显微镜观察,在退火的纳米晶Cu中观察到V形多个孪晶。 V形多重孪晶的密度明显取决于晶粒尺寸。随着晶粒尺寸的减小,V形多晶孪晶的数量先增大然后减小,在40 nm的临界晶粒尺寸处达到最大值,并表现出明显的晶粒尺寸依赖性。基于协同晶粒旋转和晶界迁移提出了V形多晶孪晶的形成机理。但是,V型多晶孪晶的数量在临界晶粒尺寸以下显着降低,这归因于晶粒旋转介导的单晶生长。 (C)2015 Elsevier B.V.保留所有权利。

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