机译:发光二极管阵列失准引起的测量误差的发光强度校正方法
Joint Research Center for Optomechatronics Engineering, School of Optics and Photonics, Beijing Institute of Technology, Beijing, China,Shenzhen Research Institute, Beijing Institute of Technology, Shenzhen, China;
Joint Research Center for Optomechatronics Engineering, School of Optics and Photonics, Beijing Institute of Technology, Beijing, China,Shenzhen Research Institute, Beijing Institute of Technology, Shenzhen, China;
Joint Research Center for Optomechatronics Engineering, School of Optics and Photonics, Beijing Institute of Technology, Beijing, China,Shenzhen Research Institute, Beijing Institute of Technology, Shenzhen, China;
Joint Research Center for Optomechatronics Engineering, School of Optics and Photonics, Beijing Institute of Technology, Beijing, China,Shenzhen Research Institute, Beijing Institute of Technology, Shenzhen, China;
机译:发光二极管阵列测角光度法失准引起的测量误差分析
机译:利用光源-目标发光强度映射的方法对发光二极管均匀照明的自由透镜设计
机译:发光二极管发光强度的分析方法
机译:基于相移法的3D形状测量的强度误差校正
机译:具有故障时间数据的中介分析中的协变量测量误差校正方法。
机译:设计构造和利用发光二极管和发光二极管耦合光纤阵列进行多站点脑光传输的过程
机译:三维声音强度测量精度的数值评估及纠错方法的提案