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首页> 外文期刊>Langmuir >Stick−Slip Phenomenon in Measurements of Dynamic Contact Angles and Surface Viscoelasticity of Poly(styrene-b-isoprene-bstyrene) Triblock Copolymers
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Stick−Slip Phenomenon in Measurements of Dynamic Contact Angles and Surface Viscoelasticity of Poly(styrene-b-isoprene-bstyrene) Triblock Copolymers

机译:聚(苯乙烯-b-异戊二烯-b苯乙烯)三嵌段共聚物的动态接触角和表面粘弹性的测量中的粘滑现象

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In this paper, a series of poly(styrene-bisoprene-nb-styrene) triblock copolymers (SIS), with differentnchemical components, was synthesized by anionic polymerization.nThe relationships between surface structures of thesenblock copolymers and their stick−slip phenomena wereninvestigated. There is a transition from stick−slip to a closelynsmooth motion for the SIS films with increasing PS content;nthe patterns almost vanish and the three-phase line appears tonmove overall smoothly on the film surface. The results shownthat the observed stick−slip pattern is strongly dependent onnsurface viscoelasticity. The jumping angle Δθ, which is definednas θ1 − θ2 (when a higher limit to θ1 is obtained, the triple linen“jumps” from θ1 to θ2 with increases in drop volume), was employed to scale the stick−slip behavior on various SIS film surfaces.nScanning force microscopy/atomic force microscopy (AFM) and sum frequency generation methods were used to investigate thensurface structures of the films and the contributions of various possible factors to the observed stick−slip behavior. It was foundnthat there is a linear relationship between jumping angle Δθ and the slope of the approach curve obtained from AFM forcenmeasurement. This means that the stick−slip behavior may be attributed mainly to surface viscoelasticity for SIS blockncopolymers. The measurement of jumping angle Δθ may be a valuable method for studying surface structure relaxation ofnpolymer films.
机译:本文通过阴离子聚合反应合成了具有不同化学成分的一系列聚(苯乙烯-双戊二烯-nb-苯乙烯)三嵌段共聚物(SIS)。研究了sen嵌段共聚物的表面结构与其粘滑现象之间的关系。随着PS含量的增加,SIS薄膜从粘滑运动过渡到紧密运动; n的图案几乎消失,三相线在薄膜表面上总体上平滑移动。结果表明,观察到的粘滑模式很大程度上取决于表面粘弹性。跳跃角Δθ定义为θ1-θ2(当获得较高的θ1极限时,随着液滴体积的增加,三层亚麻布从“θ1”跃迁至θ2),用于衡量各种SIS上的粘滑行为使用扫描力显微镜/原子力显微镜(AFM)和总频率生成方法来研究薄膜的表面结构以及各种可能的因素对观察到的粘滑行为的影响。结果发现,跳跃角Δθ与通过AFM测力获得的逼近曲线的斜率之间存在线性关系。这意味着粘滑行为可能主要归因于SIS嵌段共聚物的表面粘弹性。跳跃角Δθ的测量可能是研究聚合物膜的表面结构弛豫的有价值的方法。

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