Depth Profiling of Phase composition and Texture n Layered-Graded Al_2O_3-& Ti_3SiC_2-Based Systems Using X-ray and Synchrotron Radiation Diffraction

摘要

This paper deals with depth profiling of phase composition and texture in layered-graded ceramic systems based on alumina and Ti_2SiC_2. Both qualitative and quantitative depth-profiles by XRD and SRD have revealed the gradation of phase composition and texture at the near-surface both At the micrometre and nanometre scale. The SRD experiments have been conducted using the BIGDIFF Debye-Scherrer diffractometer at (a) wavelengths of 0.8-1.6 A, and (b) grazing angles of 0.1-5.0°, under in vacuo conditions.