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首页> 外文期刊>Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films >Metal-organic chemical vapor deposition of aluminum oxide thin films via pyrolysis of dimethylaluminum isopropoxide
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Metal-organic chemical vapor deposition of aluminum oxide thin films via pyrolysis of dimethylaluminum isopropoxide

机译:通过异丙醇二甲基铝热解法对氧化铝薄膜进行金属有机化学气相沉积

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Metal-organic chemical vapor deposited aluminum oxide films were produced via pyrolysis of dimethylaluminum isopropoxide in a high vacuum reaction chamber in the 417–659 °C temperature range. Deposited films contained aluminum, oxygen, and carbon, and the carbon-to-aluminum ratio increased with increased deposition temperature. Aluminum-carbon bonding was observed in films deposited at 659 °C by x-ray photoelectron spectroscopy, but not in films deposited at 417 °C. The apparent activation energy in the surface reaction controlled regime was 91 kJ/mol. The O/Al and C/Al ratios in the deposited films were greater and less than, respectively, the ratios predicted by the stoichiometry of the precursor. Flux analysis of the deposition process suggested that the observed film stoichiometries could be explained by the participation of oxygen-containing background gases present in the reactor at its base pressure.
机译:金属有机化学气相沉积的氧化铝膜是通过在417–659 C温度范围内的高真空反应室中对异丙醇二甲基铝进行热解而制得的。沉积的膜包含铝,氧和碳,并且碳铝比随沉积温度的升高而增加。通过X射线光电子能谱法在659 C的薄膜中观察到铝-碳键合,而在417 C的薄膜中则没有观察到铝-碳键合。在表面反应控制方案中的表观活化能为91kJ / mol。沉积膜中的O / Al和C / Al比分别大于和小于通过前体的化学计量预测的比。沉积过程的通量分析表明,观察到的薄膜化学计量可以用反应器在其基本压力下存在的含氧背景气体的参与来解释。

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