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Electron Density Measurements Behind Strong Shock Waves by H-β Profile Matching

机译:H-β轮廓匹配在强冲击波后面的电子密度测量

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Emission spectroscopy was performed in a free-piston double-diaphragm shock tube to measure the electron density behind a strong shock wave, using nitrogen as the test gas. Time-frozen spectra from behind the shock wave were taken by an image-intensified charge-coupled device camera with a gate width of 100 ns. The laser schlieren diagnostics was used to detect the shock arrival and to correlate observed spectra with the distance from the shock front accurately. The electron density was measured by means of a line profile matching technique, using the H-β line broadened by the Stark effect. Using this measurement system, the electron density distribution was obtained with a high spatial resolution of +-0.6 mm at a shock velocity of 12 km/s. Experimental results show that, especially at high shock velocities, the measured electron density increases more quickly behind the shock front than predicted by the thermal and chemical nonequilibrium models widely used. Several drawbacks in the conventional ionization model at high shock velocities are pointed out.
机译:使用氮气作为测试气体,在自由活塞双隔膜激波管中进行发射光谱分析,以测量强激波后的电子密度。来自冲击波后面的时间冻结光谱是由图像增强的电荷耦合器件相机拍摄的,其栅极宽度为100 ns。激光schlieren诊断程序用于检测冲击的到来,并将观察到的光谱与到冲击前的距离精确相关。通过斯塔克效应加宽的H-β线,通过线轮廓匹配技术来测量电子密度。使用该测量系统,在12 km / s的冲击速度下,电子密度分布具有+ -0.6 mm的高空间分辨率。实验结果表明,尤其是在高冲击速度下,测得的电子密度在冲击前沿后方的增加比通过广泛使用的热和化学非平衡模型所预测的更快。指出了常规电离模型在高冲击速度下的几个缺点。

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