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Synthesis of Butane-Like SiGe Hydrides:Enabling Precursors for CVD of Ge-Rich Semiconductors

机译:类似于丁烷的SiGe氢化物的合成:为Ge-Rich半导体的CVD提供前体

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摘要

The synthesis of butane-like (GeH_3)_2(SiH_2)_2 (1),(GeH_3)_2SiH(SiH_3)(2),and (GeH_3)_2(SiH_2GeH_2)(3)Si-Ge hydrides with applications in low-temperature synthesis of Ge-rich Si_(1-x)Ge_x optoelectronic alloys has been demonstrated.The compositional,vibrational,structural,and thermochemical properties of these compounds were studied by FTIR,multinuclear NMR,mass spectrometry,Rutherford backscattering,and density functional theory (DFT)simulations.The analyses indicate that the linear (GeH_3)_2(SiH_2)_2 (1)and (GeH_3)_2(SiH_2GeH_2)(3)compounds exist as a mixture of the classic normal (n)and gauche (g)conformational isomers which do not seem to interconvert at 22 deg C.The conformational proportions in the samples were determined using a new fitting procedure,which combines calculated molecular spectra to reproduce those observed by varying the global intensity,frequency scale,and admixture coefficients of the individual conformers.The (GeH_3)_2(SiH_2)_2 (1)species was then utilized to fabricate Si_(0.50)Ge_(0.50)semiconductor alloys reflecting exactly the Si/Ge content of the precursor.Device quality layers were grown via gas source MBE directly on Si(100)at unprecedented low temperatures 350-450 deg C and display homogeneous compositional and strain profiles,low threading dislocation densities,and atomically planar surfaces.Low energy electron microscopy (LEEM)analysis has demonstrated that the precursor is highly reactive on Si(100)surfaces,with H_2 desorption kinetics comparable to those of Ge_2H_6,despite the presence of strong Si-H bonds in the molecular structure.
机译:丁烷状(GeH_3)_2(SiH_2)_2(1),(GeH_3)_2SiH(SiH_3)(2)和(GeH_3)_2(SiH_2GeH_2)(3)Si-Ge氢化物的合成及其在低温下的应用已经证明了富含Ge的Si_(1-x)Ge_x光电合金的合成。通过FTIR,多核NMR,质谱,卢瑟福反向散射和密度泛函理论研究了这些化合物的组成,振动,结构和热化学性质。 DFT模拟。分析表明,线性(GeH_3)_2(SiH_2)_2(1)和(GeH_3)_2(SiH_2GeH_2)(3)化合物以经典正态(n)和gauche(g)构象的混合物形式存在异构体似乎在22摄氏度下不会相互转化。使用新的拟合程序确定样品中的构象比例,该程序结合计算出的分子光谱以重现通过改变个体的整体强度,频率范围和混合系数而观察到的那些然后将(GeH_3)_2(SiH_2)_2(1)种用于精确地反映出前驱体的Si / Ge含量的Si_(0.50)Ge_(0.50)半导体合金。器件质量层是通过气体源MBE在前所未有的低温350-450℃下直接在Si(100)上生长的,并显示出均匀的成分低能电子显微镜(LEEM)分析表明,该前体在Si(100)表面上具有高反应活性,尽管存在,但H_2的解吸动力学与Ge_2H_6相当。分子结构中强大的Si-H键的结构

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  • 来源
    《Journal of the American Chemical Society》 |2006年第21期|p.6919-6930|共12页
  • 作者单位

    Contribution from the Department of Chemistry and Biochemistry,Department of Physics and Astronomy,and Center for Solid State Science,Arizona State University,Tempe,Arizona,85287;

    Contribution from the Department of Chemistry and Biochemistry,Department of Physics and Astronomy,and Center for Solid State Science,Arizona State University,Tempe,Arizona,85287;

    Contribution from the Department of Chemistry and Biochemistry,Department of Physics and Astronomy,and Center for Solid State Science,Arizona State University,Tempe,Arizona,85287;

    Contribution from the Department of Chemistry and Biochemistry,Department of Physics and Astronomy,and Center for Solid State Science,Arizona State University,Tempe,Arizona,85287;

    Contribution from the Department of Chemistry and Biochemistry,Department of Physics and Astronomy,and Center for Solid State Science,Arizona State University,Tempe,Arizona,85287;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);美国《化学文摘》(CA);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 化学;
  • 关键词

  • 入库时间 2022-08-18 03:22:43

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