Test Approach to Assess Solar Array Diode Board Susceptibility to Sustained Arcing

摘要

A test method of assessing sustained vacuum arc risk in satellite power systems is demonstrated. This method extends a recently issued international test standard from the front side of the solar array to the back side of the array and other parts of the spacecraft power system. The data acquisition system can detect transients ranging from submicrosecond electrostatic surface discharges and the associated nonsustained secondary shunt currents to sustained shunt currents of durations up to 15 s. This is essential to observe long-duration self-sustaining vacuum arcs and their transition to a low impedance shunt that creates the permanent loss of power. Data from a solar array diode board that failed the test are used to demonstrate the setup.