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机译:使用大电流注入法对I / O缓冲区的电磁敏感性进行分析
Department of Semiconductor Systems Engineering, College of Information and Communication Engineering, Sungkyunkwan University, Suwon, Korea;
Department of Semiconductor Systems Engineering, College of Information and Communication Engineering, Sungkyunkwan University, Suwon, Korea;
Department of Semiconductor Systems Engineering, College of Information and Communication Engineering, Sungkyunkwan University, Suwon, Korea;
I/O buffer; bulk current injection (BCI); electromagnetic compatibility (EMC); electromagnetic susceptibility (EMS); injection probe; on-chip power grid; on-chip decoupling capacitor;
机译:堆积电流喷射对平行双线耦合通道中电磁辐射的测试方法的研究
机译:用于高级电磁脉冲辐射磁化率测试的双端口脉冲差分模式电流注入方法
机译:天线系统电磁脉冲场磁化率评估的脉冲差分模式电流注入方法
机译:散装电缆电流注入与辐射场磁化率测试方法的比较
机译:散装半导体中电子自旋群和弹性旋转电流的间隙光学注射和控制
机译:基于电位缓冲液的电位流注入分析的氧化还原物质快速自动分析方法
机译:替换平行双线耦合通道电磁辐射的批量电流喷射试验方法研究