首页> 外文期刊>Journal of Pressure Vessel Technology >The Effect of Autofrettage on Uniform Arrays of Three-Dimensional Unequal-Depth Cracks in a Thick-Walled Cylindrical Vessel
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The Effect of Autofrettage on Uniform Arrays of Three-Dimensional Unequal-Depth Cracks in a Thick-Walled Cylindrical Vessel

机译:自增强对厚壁圆柱容器中三维不等深度三维裂纹均匀阵列的影响

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摘要

The distribution of the mode I stress intensity factor (SIF), resulting from autofrettage, along the fronts of radial, semi-elliptical surface cracks pertaining to large uniform arrays of unequal-depth cracks emanating at the bore of an overstrained thick-walled cylinder is studied. The three-dimensional analysis is based on the "two-crack depth level model" previously proposed and is performed via the finite element method employing singular elements along the crack front. The autofrettage residual stress field is simulated using an equivalent thermal load. The distribution of K_(IA), the stress intensity factor due to autofrettage, for numerous uneven array configurations bearing n=n_1+n_2=8-128 cracks, a wide range of crack depth-to-wall thickness ratios, a_1/t=0.01-0.4, and various crack ellipticities, a_1/c_1=0.3-1.5, are evaluated for a cylinder of radii ratio R_o/R_i=2. The results clearly indicate that unevenness, as reflected in K_(IA) distribution, depends on all three parameters (i.e., the number of cracks in the array, cracks' depth, and cracks' ellipticity). The "interaction range" for the different combinations of crack arrays and crack depths is then evaluated. The range of influence between adjacent cracks on the maximal SIF, K_(A max), is found to be dependent on the density of the array, as reflected in the intercrack aspect ratio, as well as on the cracks' ellipticity.
机译:由自动强化导致的模式I应力强度因子(SIF)沿径向,半椭圆形表面裂纹的前部分布,该裂纹与在过度应变的厚壁圆柱孔处产生的均匀大的不等深裂纹的均匀阵列有关。研究。三维分析基于先前提出的“双裂纹深度级别模型”,并且是通过沿裂纹前沿采用奇异元素的有限元方法进行的。使用等效热负荷模拟自动玻璃钢残余应力场。 K_(IA)的分布,即由于自紧力引起的应力强度因子,对于具有n = n_1 + n_2 = 8-128条裂纹,裂纹深度与壁厚比范围很广,a_1 / t =对于半径比为R_o / R_i = 2的圆柱体,评估0.01-0.4,并评估各种裂纹椭圆率a_1 / c_1 = 0.3-1.5。结果清楚地表明,如K_(IA)分布所示,不均匀度取决于所有三个参数(即阵列中的裂纹数,裂纹深度和裂纹椭圆率)。然后评估裂纹阵列和裂纹深度的不同组合的“相互作用范围”。发现相邻裂纹之间对最大SIF的影响范围K_(A max)取决于裂纹间纵横比所反映的阵列密度以及裂纹的椭圆率。

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