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Turn-off modes of silicon carbide MOSFETs for short-circuit fault protection

机译:用于短路故障保护的碳化硅MOSFET的关断模式

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摘要

With the rapid development of semiconductor technology, the applications of silicon carbide (SiC) MOSFETs have been booming in recent years, where short-circuit fault protection plays an important role. In this paper, voltage and current waveforms under different short-circuit faults are analyzed. Then, two types of turn-off modes, namely a soft turn-off mode and a two-stage turn-off mode are introduced. The peak voltage, short-circuit energy and anti-interference performances of SiC MOSFETs under the different turn-off modes are analyzed and compared at various DC bus voltages. The obtained experimental results show that the soft turn-off mode can reduce voltage spikes. However, it needs a blanking time to improve the anti-interference performance of the system, which increases the short-circuit energy. For the two-stage turn-off mode, the anti-interference performance of the system is improved and the short-circuit energy is obviously decreased. However, the peak voltage generated by the two-stage turn-off mode is slightly larger than that of the soft turn-off mode. On the whole, the two-stage turn-off mode is more competitive than the soft turn-off mode for the short-circuit fault protection of SiC MOSFETs.
机译:随着半导体技术的快速发展,近年来,碳化硅(SIC)MOSFET的应用已经蓬勃发展,短路故障保护起着重要作用。在本文中,分析了不同短路故障下的电压和电流波形。然后,引入了两种类型的关断模式,即软关闭模式和两级关闭模式。分析了不同关断模式下SiC MOSFET的峰值电压,短路能量和抗干扰性能,并在各种直流总线电压下进行比较。所获得的实验结果表明,软关闭模式可以减少电压尖峰。然而,它需要消隐时间来提高系统的抗干扰性能,这增加了短路能量。对于两级关闭模式,系统的抗干扰性能得到改善,短路能量明显减少。然而,由两级旋转模式产生的峰值电压略大于软关闭模式的峰值电压。总的来说,两级关闭模式比SIC MOSFET短路故障保护的软关闭模式更竞争。

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