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New software tools for the calculation and display of isolated and attached interfacial-energy minimizing particle shapes

机译:新的软件工具,用于计算和显示孤立的和附加的界面能,以最大程度地减小粒子形状

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摘要

Existing methods to rapidly compute interface-energy minimizing shapes with anisotropy are collected and clarified, and new methods are introduced. A description of freely available, platform-independent software for the computation and display of equilibrium geometries is provided. The software relies on a new computational method to rapidly find equilibrium geometries. It also features a graphical user interface and includes the 32 crystallographic point groups to simplify inputting interfacial energies and their associated orientations. When a particle is completely enclosed within a single interface (isolated), the software computes and provides visualization for Wulff shapes. When a particle is enclosed by two interfaces, such as a particle at a grain boundary, the software minimizes their collective interfacial energy; if one of the interfaces is planar, the computation reproduces the Winterbottom construction. When both interfaces are deformable, the software provides a new tool for calculating the particle shape and the distortions of boundaries that are attached to it, even for highly anisotropic interfaces. The properties of particles bounded by two deformable interfaces are discussed, and applications of the software are illustrated. In some cases, the software can be used as a method to infer values of relative interfacial energies from a microscopic observation.
机译:收集并阐明了用于快速计算具有各向异性的界面能最小化形状的现有方法,并介绍了新方法。提供了免费的独立于平台的软件的描述,用于计算和显示平衡几何。该软件依靠一种新的计算方法来快速找到平衡几何。它还具有图形用户界面,并包括32个晶体学点组,以简化界面能及其相关方向的输入。当粒子完全封闭在单个界面中(隔离)时,该软件将计算并提供Wulff形状的可视化。当粒子被两个界面包围时,例如位于晶界处的粒子,该软件将它们的集体界面能降到最低。如果接口之一是平面的,则计算将重现Winterbottom构造。当两个界面都可变形时,该软件提供了一种新工具,即使对于高度各向异性的界面,也可以计算粒子形状和附着在其上的边界的变形。讨论了由两个可变形界面限制的粒子的属性,并说明了该软件的应用。在某些情况下,该软件可用作从显微镜观察中推断相对界面能值的方法。

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  • 来源
    《Journal of Materials Science》 |2012年第24期|p.8290-8302|共13页
  • 作者单位

    Massachusetts Institute of Technology, 77 Massachusetts Ave., Cambridge, MA, USA;

    Aix Marseille Université, CNRS, CINaM UMR 7325, 13288, Marseille, France;

    National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, CA, 94720, USA;

    Massachusetts Institute of Technology, 77 Massachusetts Ave., Cambridge, MA, USA;

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