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Influence of thin platinum layer on the magnetic properties of multiple layers of CVD cobalt thin films

机译:铂薄层对多层CVD钴薄膜磁性能的影响

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摘要

This paper presents the results obtained on the multiple layers of cobalt (Co)/platinuin (Pt) and cobalt (Co)/platinum (Pt)/cobalt (Co) on the oxidised silicon substrate. The cobalt layers were deposited by metal-organic chemical vapour deposition on oxidised-silicon substrates at 450 ℃, in H_2 ambient with 2-torr processing pressure. The platinum layers were deposited by E-beam evaporation in a separate vacuum system. The magnetic properties of Co/Pt/Co and Co/Pt multilayer were compared with the single cobalt layers of similar thicknesses on the oxidised silicon substrate. From the hysteresis loops it was observed that thin cobalt layers on oxidised-silicon substrate shows hard magnetic property with coercivity H_c values of 360 Oe and 500 Oe respectively for the 30- and 15-nm cobalt layers. The multiple layers of Co/Pt/Co and Co/Pt of cobalt thickness 15- and 30-nm with platinum 1.5-nm spacer-layer show significant change in magnetic properties (i.e. coercivity H_c and magnetisation M_s) and, gave soft magnetic properties with H_c values 51 and 49 Oe respectively, which are significantly less than the H_c values of single cobalt layers on oxidised silicon. Also, single and multiple layers cobalt with platinum were annealed and compared with the as-deposited layer structures. From the microstructure analysis by SEM, and AFM it was found that the single and multilayer had similar roughness. Magnetic images were observed by MFM and analyzed in terms of domain structure.
机译:本文介绍了在氧化硅衬底上的多层钴(Co)/铂金(Pt)和钴(Co)/铂(Pt)/钴(Co)上获得的结果。在2 r的处理压力下,在H_2环境下,于450℃,通过金属有机化学气相沉积沉积钴层。通过电子束蒸发在单独的真空系统中沉积铂层。将Co / Pt / Co和Co / Pt多层的磁性能与氧化硅衬底上具有相似厚度的单个钴层进行了比较。从磁滞回线可以看出,氧化硅衬底上的薄钴层显示出硬磁性能,其中30和15 nm钴层的矫顽力H_c值分别为360 Oe和500 Oe。钴厚度为15和30 nm的Co / Pt / Co和Co / Pt的多层,铂厚度为1.5 nm的隔离层,显示出磁性能(即矫顽力H_c和磁化强度M_s)的显着变化,并提供了软磁性能H_c值分别为51和49 Oe,大大小于氧化硅上单个钴层的H_c值。同样,将单层和多层含铂钴退火,并与沉积时的层结构进行比较。通过SEM和AFM的微观结构分析,发现单层和多层具有相似的粗糙度。通过MFM观察磁图像,并根据畴结构进行分析。

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  • 来源
    《Journal of materials science》 |2012年第10期|p.1881-1886|共6页
  • 作者单位

    Northern Ireland Semiconductor Research Centre, School of Electrical and Electronic Engineering and Computer Science, The Queen's University of Belfast, Belfast BT7 INN, UK;

    Northern Ireland Semiconductor Research Centre, School of Electrical and Electronic Engineering and Computer Science, The Queen's University of Belfast, Belfast BT7 INN, UK;

    Northern Ireland Semiconductor Research Centre, School of Electrical and Electronic Engineering and Computer Science, The Queen's University of Belfast, Belfast BT7 INN, UK;

    Northern Ireland Semiconductor Research Centre, School of Electrical and Electronic Engineering and Computer Science, The Queen's University of Belfast, Belfast BT7 INN, UK;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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