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首页> 外文期刊>Journal of materials science >Enhanced electrochemiluminescence behavior of C,N quantum dots embedded g-C_3N_4 nanosheets and its sensing application for copper (Ⅱ)
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Enhanced electrochemiluminescence behavior of C,N quantum dots embedded g-C_3N_4 nanosheets and its sensing application for copper (Ⅱ)

机译:嵌入g-C_3N_4纳米片的C,N量子点的增强化学发光行为及其对铜的传感应用(Ⅱ)

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摘要

Electrochemiluminescence (ECL) is a very sensitive method for trace analysis because of its background interference and high signal-to-noise ratio. In the past decade, the determination of Cu2+ in environment has attracted considerable attention since it plays an essential role in many physiological processes. Herein, a novel ECL sensor based on C,N quantum dots embedded g-C3N4 nanosheets (C,N-QDs@NSs) was constructed for the detection of Cu2+. The nanocomposite was rapidly obtained via the oxidation of normal g-C3N4 in H2O2 solution using sonochemical synthesizing method. Due to the abundant surface defects on C,N-QDs@NSs, the ECL intensity was magnified 2.5 times for using a C,N-QDs@NSs electrode in comparision to a g-C3N4 modified electrode. Besides, C,N-QDs@NSs could accelerate the rate of electron transfer in ECL reaction and thus resulted in the lower cathodic peak potential. Significantly, Cu2+ could effectively quench the ECL of C,N-QD@NSs, which endowed C,N-QD@NSs with a great advantage in the ECL detection of Cu2+. under optimum conditions, C,N-QDs@NSs modified electrode exhibited a linear detection range from 5x10(-4) to 10 mu M with a detection limit of 2x10(-4)mu M (S/N=3) for Cu2+, and was finally applied to detect Cu2+ in real samples with satisfactory results.
机译:电化学发光(ECL)由于其背景干扰和高信噪比,因此是一种非常灵敏的痕量分析方法。在过去的十年中,环境中Cu2 +的测定引起了人们的极大关注,因为它在许多生理过程中起着至关重要的作用。本文中,构建了一种基于C,N个量子点的嵌入式g-C3N4纳米片(C,N-QDs @ NSs)的新型ECL传感器,用于检测Cu2 +。使用声化学合成方法,通过在H2O2溶液中氧化正常g-C3N4,可以快速获得纳米复合材料。由于在C,N-QDs @ NSs上存在大量表面缺陷,与使用g,C3N4修饰电极相比,使用C,N-QDs @ NSs电极的ECL强度被放大了2.5倍。此外,C,N-QDs @ NSs可以加速ECL反应中电子的转移速度,从而导致较低的阴极峰电位。值得注意的是,Cu2 +可以有效地淬灭C,N-QD @ NSs的ECL,从而赋予C,N-QD @ NSs ECL检测Cu2 +很大的优势。在最佳条件下,C,N-QDs @ NSs修饰电极的线性检测范围为5x10(-4)到10μM,Cu2 +的检测极限为2x10(-4)mu M(S / N = 3),最终用于实际样品中Cu2 +的检测,结果令人满意。

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  • 来源
    《Journal of materials science 》 |2018年第24期| 20580-20587| 共8页
  • 作者单位

    Hefei Normal Univ Dept Chem & Chem Engn Hefei 230601 Anhui Peoples R China;

    Tongji Univ Sch Chem Sci & Engn Shanghai 200092 Peoples R China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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