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首页> 外文期刊>Journal of Materials Research >Finite element analysis of residual stress and interlayer in hard coating/interlayer/soft substrate system during nanoindentation
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Finite element analysis of residual stress and interlayer in hard coating/interlayer/soft substrate system during nanoindentation

机译:纳米压痕过程中硬涂层/中间层/软基底系统中残余应力和中间层的有限元分析

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摘要

The mechanical properties of thin films are frequently evaluated using nanoindentation. The finite element method (FEM) is very effective for investigating the stress and strain fields of the film-substrate system during nanoindentation. However, the role of residual stress and the thin interlayer between the film and substrate is not well known, especially when the hard coating/interlayer/soft substrate are considered together. In this work, the FEM is used to investigate the load-displacement behavior of the hardness of the hard coating/interlayer/soft substrate system. The load-displacement process is simulated, and the effects of different residual stresses and interlayer thicknesses are discussed.
机译:经常使用纳米压痕评估薄膜的机械性能。有限元方法(FEM)对于研究纳米压痕过程中膜-基底系统的应力和应变场非常有效。但是,残余应力和薄膜与基材之间的薄中间层的作用尚不为人所知,尤其是当将硬涂层/中间层/软基材一起考虑时。在这项工作中,有限元法用于研究硬质涂层/中间层/软质基材体系硬度的载荷-位移行为。模拟了载荷-位移过程,并讨论了不同残余应力和层间厚度的影响。

著录项

  • 来源
    《Journal of Materials Research》 |2008年第5期|p.1358-1363|共6页
  • 作者

    Liuhe Li; Lan Yin; Paul K. Chu;

  • 作者单位

    School of Physics and Materials Science, City University of Hong Kong, Kowloon, Hong Kong, People's Republic of China;

    and School of Mechanical Engineering and Automation, Beijing University of Aeronautics and Astronautics, Beijing 100083, China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 工程材料学;
  • 关键词

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