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Accelerated microwave-assisted synthesis and in situ X-ray scattering of tungsten-substituted vanadium dioxide(V_(1-x)W_xO_2)

机译:加速微波辅助合成及原位X射线散射钨取代的二氧化钒(V_(1-x)W_XO_2)

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摘要

Vanadium dioxide (VO_2) has been widely studied due to its metal-insulator phase transition at 68 °C, below which it is a semiconducting monoclinic phase, P2_1/c, and above it is a metallic tetragonal phase, P4_2/mnm. Substituting vanadium with transition metals allows transition temperature tunability. An accelerated microwave-assisted synthesis for VO_2 and 5d tungsten-substituted VO_2 presented herein decreased synthesis time by three orders of magnitude while maintaining phase purity, particle size, and transition character. Tungsten substitution amount was determined using inductively coupled plasma-optical emission spectroscopy. Differential scanning calorimetry, superconducting quantum interference device measurements, and in situ heating and cooling experiments monitored through synchrotron X-ray diffraction (XRD) confirmed the transition temperature decreased with increased tungsten substitution. Scanning electron microscopy analyzed through the line-intercept method produced an average particle size of 3-5 urn. Average structure and local structure phase purity was determined through the Rietveld analysis of synchrotron XRD and the least-squares refinement of pair distribution function data.
机译:由于其金属绝缘体相转变在68℃下,二氧化钒(VO_2)已被广泛研究,下面是半导体单斜相,P2_1 / C,及其上方,它是金属四方相,P4_2 / MNM。用过渡金属替代钒允许过渡温度可调性。本文呈现的VO_2和5D钨 - 取代的VO_2的加速微波辅助合成在保持相纯度,粒度和转变特征的同时减少了三个数量级的合成时间。使用电感耦合等离子体光发射光谱法测定钨取代量。差分扫描量热法,超导量子干扰装置测量和通过同步X射线衍射(XRD)监测的原位加热和冷却实验证实了随着钨代替增加的转变温度降低。通过线路截距方法分析的扫描电子显微镜产生3-5瓮的平均粒度。通过RIETVELD XRD的分析和对分布函数数据的最小二乘法测定的平均结构和局部结构相纯度。

著录项

  • 来源
    《Journal of Materials Research》 |2021年第1期|268-280|共13页
  • 作者单位

    Department of Materials Science and Engineering The Ohio State University Columbus Ohio 43212 USA Center for Electron Microscopy and Analysis The Ohio State University Columbus Ohio 43212 USA;

    Department of Materials Science and Engineering The Ohio State University Columbus Ohio 43212 USA Center for Electron Microscopy and Analysis The Ohio State University Columbus Ohio 43212 USA;

    Department of Materials Science and Engineering The Ohio State University Columbus Ohio 43212 USA Center for Electron Microscopy and Analysis The Ohio State University Columbus Ohio 43212 USA;

    Department of Materials Science and Engineering The Ohio State University Columbus Ohio 43212 USA Center for Electron Microscopy and Analysis The Ohio State University Columbus Ohio 43212 USA;

    X-ray Science Division Advanced Photon Source Argonne National Laboratory Lemont Illinois 60439 USA;

    Brockhouse Beamlines Canadian Light Source Saskatoon Saskatchewan S7N 2V3 Canada;

    Department of Materials Science and Engineering The Ohio State University Columbus Ohio 43212 USA Center for Electron Microscopy and Analysis The Ohio State University Columbus Ohio 43212 USA Department of Mechanical and Aerospace Engineering The Ohio State University Columbus Ohio 43210 USA;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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