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An overview of interface-dominated deformation mechanisms in metallic nanocomposites elucidated using in situ straining in a TEM

机译:TEM中原位应变阐明的金属纳米复合材料中界面主导的变形机理概述

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摘要

Nanostructured multiphase metallic materials present extraordinary properties, such as high strength, enhanced fatigue and radiation resistance, and thermal stability, compared to conventional bulk metallic materials. Previous research studies have shown that their deformation and fracture behavior are dominated by defect interactions at internal interfaces. In situ straining, including nanoindentation, compression, and tension, in a transmission electron microscope (TEM) has emerged as a powerful tool to investigate the physics of defect-interface interactions at the nano-scale and even atomic scale. The mechanistic insights gained from these experiments coupled with dislocation theory and atomistic modeling has helped develop a fundamental understanding of the mechanical properties. In this article, through some recent investigations on observing dislocation and interface activities, crack propagation, and nanopillar compression, we present current progress in utilizing in situ TEM straining to examine interface-dominated deformation mechanisms.
机译:与常规的块状金属材料相比,纳米结构的多相金属材料具有非凡的性能,例如高强度,增强的抗疲劳性和抗辐射性以及热稳定性。以前的研究表明,它们的变形和断裂行为受内部界面缺陷相互作用的支配。透射电子显微镜(TEM)中的原位应变,包括纳米压痕,压缩和拉力,已成为研究纳米级甚至原子级缺陷界面相互作用的物理学的强大工具。从这些实验中获得的机械学见识与位错理论和原子建模相结合,有助于发展对机械性能的基本了解。在本文中,通过最近对位错和界面活性,裂纹扩展和纳米柱压缩的研究,我们介绍了利用原位TEM应变研究界面主导的变形机制的最新进展。

著录项

  • 来源
    《Journal of Materials Research》 |2019年第9期|1469-1478|共10页
  • 作者

    Cui Yuchi; Li Nan; Misra Amit;

  • 作者单位

    Univ Michigan, Dept Mat Sci & Engn, Ann Arbor, MI 48109 USA;

    Los Alamos Natl Lab, Ctr Integrated Nanotechnol, Los Alamos, NM 87545 USA;

    Univ Michigan, Dept Mat Sci & Engn, Ann Arbor, MI 48109 USA|Univ Michigan, Dept Mech Engn, Ann Arbor, MI 48109 USA;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    nanostructure; strength; transmission electron microscopy (TEM);

    机译:纳米结构;强度;透射电镜(TEM);

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