Effect of low-frequency AC magnetic susceptibility of Ru/Co_(60)Fe_(20)V_(20) and Ta/Co_(60)Fe_(20)V_(20) films

摘要

In this study, the maximum alternating current (AC) magnetic susceptibility (chi(ac)) and optimal resonance frequency (f(res)) of (a) glass/Ru (X nm)/Co60Fe20V20(5 nm) and (b) glass/Ta(Y nm)/Co60Fe20V20(5 nm) films at room temperature (RT) were investigated through low-frequency AC magnetic susceptibility (chi(ac)) measurement, where X and Y each ranged from 5 to 10 nm. The variation of the highest. ac at the optimal resonance frequency (f(res)), at which the spin sensitivity is maximal, was examined using an experiment. The results indicated that. ac decreased as the frequency was increased. The maximum. ac of glass/Ru(9 nm)/Co60Fe20V20(5 nm) and glass/Ta (8 nm)/Co60Fe20V20(5 nm) was 20.6x10(-3) and 15.5x10(-3) at fres 100 Hz and 1000 Hz, respectively. The maximum. ac of glass/Ru(9 nm)/Co60Fe20V20(5 nm) was 1.3 times larger than that of glass/Ta(8 nm)/ Co60Fe20V20(5 nm). This indicated that the effect of the Ru seed layer is apparently suitable for low-frequency magnetic recording applications.