Direct method for magnetostriction coefficient measurement based on atomic force microscope, illustrated by the example of Tb-Co film

摘要

This paper presents a method based on the Atomic Force Microscopy technique for direct measurement of magnetostriction coefficient of amorphous Tb-Co films deposited on Si(100) substrate. The magnetostriction coefficient of the film is determined by AFM measuring the deflection of the sample when applying a magnetic field. In order to maximize the deflection of the sample, in-plane magnetic aniso-tropy was induced by heat treatment under a magnetic field of 5 kOe. The value obtained for the saturation magnetostriction is 204 × 10~(-6) for the Tb_(23)Co_(77) film.