首页> 外文期刊>Journal of Lightwave Technology >Loss Cause Identification by Evaluating Backscattered Modal Loss Ratio Obtained With 1-μm-Band Mode-Detection OTDR
【24h】

Loss Cause Identification by Evaluating Backscattered Modal Loss Ratio Obtained With 1-μm-Band Mode-Detection OTDR

机译:通过评估1-μm频带模式检测OTDR获得的反向散射模态损耗比来确定损耗原因

获取原文
获取原文并翻译 | 示例
           

摘要

We propose a novel diagnostic technique that uses 1-μm-band mode-detection optical time domain reflectometry (1 μm-OTDR) to identify the loss causes such as macrobends and fusion splices, of single-mode fibers. 1 μm-OTDR, which employs 1-μm-band probe pulses and a mode selective coupler operating in the same band, enables us to individually observe the fundamental (LP01) and the second-order (LP11) modes of the backscattered light generated in the two-mode region of single-mode fibers. Evaluating the ratio of losses occurring in the LP01 to LP11 modes of the backscattered light allows us to determine whether the cause of loss is a macrobend or a fusion splice. A proof-of-concept demonstration is performed for two kinds of widely used single-mode fibers, and the results show that macrobending and fusion splice losses can be clearly identified.
机译:我们提出了一种新颖的诊断技术,该技术使用1-μm波段模式检测光时域反射仪(1μm-OTDR)来识别单模光纤的损耗原因,例如宏弯和熔接。 1μm-OTDR使用1μm波段的探测脉冲和在同一波段内工作的模式选择耦合器,使我们能够分别观察在电子显微镜中产生的反向散射光的基本(LP01)和二阶(LP11)模式。单模光纤的双模区域。评估在背向散射光的LP01和LP11模式下发生的损耗比率,可以确定损耗的原因是宏弯还是熔接。对两种广泛使用的单模光纤进行了概念验证,结果表明可以清楚地识别出宏弯和熔接损耗。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号