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Benchmarking Si, SiGe, and III–V/Si Hybrid SIS Optical Modulators for Datacenter Applications

机译:用于数据中心应用的Si,SiGe和III–V / Si混合SIS光学调制器的基准测试

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摘要

Recently, Si-photonics received a growing interest and started to move from laboratories to industrial product development, mainly for the applications inside data-centers. One of the weaknesses of Si is its relatively low plasma dispersion efficiency, making the size of phase modulator large. This efficiency can be improved by using the heterogeneous integration of material such as InP, InGaAsP, or SiGe to fabricate hybrid semiconductor- insulator-semiconductor (SIS) optical phase modulators. At the same time, the standard figure of merit for modulator benchmarking VL does not consider the dynamic behavior of the SIS devices, nor is making the link with the system level specifications such as optical modulation amplitude (OMA), widely used in 100G to 400G parallel single mode or coarse wavelength division multiplexing applications. In this paper, we propose to simply link the modulator performance to the OMA, to derive a compact model for SIS devices and to compare hybrid device performances for various materials.
机译:最近,Si-photonics引起了越来越多的兴趣,并开始从实验室转向工业产品开发,主要用于数据中心内部的应用。 Si的缺点之一是其相对较低的等离子体分散效率,从而使相调制器的尺寸变大。通过使用材料(例如InP,InGaAsP或SiGe)的异质集成来制造混合半导体-绝缘体-半导体(SIS)光学相位调制器,可以提高效率。同时,用于调制器基准测试VL的标准品质因数既未考虑SIS器件的动态性能,也未与广泛用于100G至400G的系统级规范(例如光调制幅度(OMA))建立联系。并行单模或粗波分复用应用。在本文中,我们建议将调制器性能与OMA进行简单链接,以得出SIS器件的紧凑模型,并比较各种材料的混合器件性能。

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