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首页> 外文期刊>Journal of Lightwave Technology >An Analysis on the Optimization of Closed-Loop Detection Method for Optical Voltage Sensor Based on Pockels Effect
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An Analysis on the Optimization of Closed-Loop Detection Method for Optical Voltage Sensor Based on Pockels Effect

机译:基于普克尔斯效应的光电压传感器闭环检测方法优化分析

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摘要

In engineering practice, the closed-loop optical voltage sensor (OVS) based on Pockels effect cannot reach the required precision level mainly due to the various disturbance and noise of system, so the application of OVS for low voltage measurement is restricted. Considering the cross coupling of the main and second closed-loops, the model of disturbance and noise of system that adopts the four-state modulation method is analyzed in the main closed-loop of OVS. Based on the established noise-perturbed stochastic model of OVS, we design a closed-loop detection algorithm for the OVS system to guarantee the mean-square exponential stability with a prescribed $H_infty$ performance in order to optimize the detection precision of OVS. The experimental results show that the detection precision of OVS is 0.144 V while the relative measurement error of the scale factor is within ± 0.15% in measuring low AC voltages from 140 to 500 V, which verifies the effectiveness of the proposed detection scheme.
机译:在工程实践中,由于系统的各种干扰和噪声,基于普克尔斯效应的闭环光电压传感器(OVS)不能达到要求的精度水平,因此限制了OVS在低压测量中的应用。考虑到主闭环和第二闭环的交叉耦合,在OVS主闭环中分析了采用四态调制方法的系统扰动和噪声模型。基于已建立的OVS噪声干扰随机模型,我们设计了一种OVS系统闭环检测算法,以保证具有规定的$ H_infty $性能的均方指数稳定性,从而优化了OVS的检测精度。实验结果表明,在从140到500 V的低交流电压中测量时,OVS的检测精度为0.144 V,而比例因子的相对测量误差在±0.15%以内,证明了该检测方案的有效性。

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