Imaging Catastrophic Optical Mirror Damage in High-Power Diode Lasers

摘要

We image catastrophic optical mirror damage (COMD) in red- and infrared-emitting high-power broad-area diode lasers by combining highly COMD-selective thermography, near-field imaging, scanning electron microscopy, and cathodoluminescence. All techniques exhibit strong correlations in terms of COMD location and strength and allow for an unambiguous decision about COMD occurrence. In particular, temperatures en route to and during COMD are measured, and the concept of a critical facet temperature that induces thermal runaway is supported.